= Dell RAID 卡 = == 檢查 RAID 卡型號 == * 使用 `pciutils` 套件中的 `lspci` 指令 {{{ ~$ lspci | grep -i raid 03:00.0 RAID bus controller: LSI Logic / Symbios Logic MegaRAID SAS 2108 [Liberator] (rev 05) }}} * 使用 `smartmontools` 套件中的 `smartctl` 指令 {{{ ~$ sudo smartctl --scan /dev/sda -d scsi # /dev/sda, SCSI device /dev/sdb -d scsi # /dev/sdb, SCSI device /dev/bus/4 -d megaraid,0 # /dev/bus/4 [megaraid_disk_00], SCSI device /dev/bus/4 -d megaraid,1 # /dev/bus/4 [megaraid_disk_01], SCSI device /dev/bus/4 -d megaraid,4 # /dev/bus/4 [megaraid_disk_04], SCSI device /dev/bus/4 -d megaraid,5 # /dev/bus/4 [megaraid_disk_05], SCSI device }}} {{{ ~$ sudo smartctl -d scsi -a /dev/sda smartctl 6.2 2013-07-26 r3841 [x86_64-linux-4.4.0-98-generic] (local build) Copyright (C) 2002-13, Bruce Allen, Christian Franke, www.smartmontools.org === START OF INFORMATION SECTION === Vendor: DELL Product: PERC H700 Revision: 2.10 User Capacity: 898,990,342,144 bytes [898 GB] Logical block size: 512 bytes Logical Unit id: 0x6782bcb064ffe400213fc03a08c8a728 Serial number: 0028a7c8083ac03f2100e4ff64b0bc82 Device type: disk Local Time is: Tue Nov 28 17:48:32 2017 CST SMART support is: Unavailable - device lacks SMART capability. === START OF READ SMART DATA SECTION === Error Counter logging not supported Device does not support Self Test logging }}} 要繞過 RAID 卡的話，不能用 scsi 型態，要根據 scan 結果 {{{ ~$ sudo smartctl -a /dev/bus/4 -d sat+megaraid,0 smartctl 6.2 2013-07-26 r3841 [x86_64-linux-4.4.0-98-generic] (local build) Copyright (C) 2002-13, Bruce Allen, Christian Franke, www.smartmontools.org === START OF INFORMATION SECTION === Device Model: PLEXTOR PX-256S3C Serial Number: P02721101697 LU WWN Device Id: 5 002303 100e60e35 Firmware Version: 1.01 User Capacity: 256,060,514,304 bytes [256 GB] Sector Size: 512 bytes logical/physical Rotation Rate: Solid State Device Device is: Not in smartctl database [for details use: -P showall] ATA Version is: ACS-2 (minor revision not indicated) SATA Version is: SATA 3.1, 6.0 Gb/s (current: 6.0 Gb/s) Local Time is: Tue Nov 28 17:50:13 2017 CST SMART support is: Available - device has SMART capability. SMART support is: Enabled === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED Warning: This result is based on an Attribute check. General SMART Values: Offline data collection status: (0x00) Offline data collection activity was never started. Auto Offline Data Collection: Disabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: ( 0) seconds. Offline data collection capabilities: (0x11) SMART execute Offline immediate. No Auto Offline data collection support. Suspend Offline collection upon new command. No Offline surface scan supported. Self-test supported. No Conveyance Self-test supported. No Selective Self-test supported. SMART capabilities: (0x0003) Saves SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. General Purpose Logging supported. Short self-test routine recommended polling time: ( 1) minutes. Extended self-test routine recommended polling time: ( 10) minutes. SCT capabilities: (0x003d) SCT Status supported. SCT Error Recovery Control supported. SCT Feature Control supported. SCT Data Table supported. SMART Attributes Data Structure revision number: 1 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE 1 Raw_Read_Error_Rate 0x002f 100 100 000 Pre-fail Always - 0 5 Reallocated_Sector_Ct 0x0003 100 100 000 Pre-fail Always - 0 9 Power_On_Hours 0x0002 100 100 000 Old_age Always - 1318 12 Power_Cycle_Count 0x0003 100 100 000 Pre-fail Always - 7 170 Unknown_Attribute 0x0032 100 100 000 Old_age Always - 0 171 Unknown_Attribute 0x0003 100 100 000 Pre-fail Always - 0 172 Unknown_Attribute 0x0003 100 100 000 Pre-fail Always - 0 173 Unknown_Attribute 0x0003 100 100 000 Pre-fail Always - 19 174 Unknown_Attribute 0x0003 100 100 000 Pre-fail Always - 2 175 Program_Fail_Count_Chip 0x0003 100 100 000 Pre-fail Always - 0 176 Erase_Fail_Count_Chip 0x0003 100 100 000 Pre-fail Always - 0 178 Used_Rsvd_Blk_Cnt_Chip 0x0003 100 100 000 Pre-fail Always - 0 179 Used_Rsvd_Blk_Cnt_Tot 0x0003 100 100 000 Pre-fail Always - 0 180 Unused_Rsvd_Blk_Cnt_Tot 0x0033 100 100 005 Pre-fail Always - 65 181 Program_Fail_Cnt_Total 0x0003 100 100 000 Pre-fail Always - 0 182 Erase_Fail_Count_Total 0x0003 100 100 000 Pre-fail Always - 0 183 Runtime_Bad_Block 0x0032 100 100 000 Old_age Always - 0 195 Hardware_ECC_Recovered 0x0003 100 100 000 Pre-fail Always - 0 199 UDMA_CRC_Error_Count 0x0003 100 100 000 Pre-fail Always - 0 232 Available_Reservd_Space 0x0003 100 100 010 Pre-fail Always - 100 233 Media_Wearout_Indicator 0x0003 100 100 000 Pre-fail Always - 6466 241 Total_LBAs_Written 0x0003 100 100 000 Pre-fail Always - 111376 242 Total_LBAs_Read 0x0003 100 100 000 Pre-fail Always - 3972 SMART Error Log Version: 1 No Errors Logged SMART Self-test log structure revision number 0 Warning: ATA Specification requires self-test log structure revision number = 1 No self-tests have been logged. [To run self-tests, use: smartctl -t] Selective Self-tests/Logging not supported }}}